Jawoollam.com Website Stats
(Updated 3460 days ago)
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General Information
Meta Description : | J.A. Woollam develops spectroscopic ellipsometer technology used for thin film and bulk materials characterization. Measures thin film thickness and material optical constants. In-situ and ex-situ, spectral ranges from Vacuum UV to Far IR. |
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Meta Keywords : | ellipsometer applications, ellipsometer, ellipsometry, spectroscopic ellipsometer, SE, multiwavelength ellipsometer, insitu, J. A. Woollam, compensator ellipsometer, CompleteEASE, WVASE32, optical properties, thin film thickness, optical constants, index o |
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Text/HTML Ratio : | 7.12% |
Website Ranks
Alexa Rank : | 3,935,550 visit Alexa |
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Compete Rank : | N/A visit Compete |
Quantcast Rank : | N/A visit Quantcast |
Website Safety
McAfee SiteAdvisor : | visit SiteAdvisor |
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WOT : | visit WOT |
Pages Indexed
Google : | 212 visit Google |
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Bing : | 16 visit Bing |
Backlinks
Google : | 38 visit Google |
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Bing : | 1 visit Bing |
Sociometer
Facebook Likes : | 17 |
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Stumbleupon : | 0 |
LinkedIn : | 0 |
Server Analysis
IP Address : | 192.186.249.188 |
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Latitude : | 33.602 |
Longitude : | -111.888 |
Region : | Scottsdale, Arizona |
Country : | United States |